Lab VIEW run four point probe device
Agumba John, Karimi Patrick, Okumu JohnKniha
Citace v seznamu literatury:
AGUMBA, John; KARIMI, Patrick a OKUMU, John. Lab VIEW run four point probe device: electrical characterization of semiconducting thin films made easy by four point probe system controlled by LabVIEW. Saarbrücken: LAP LAMBERT Academic Publishing, c2012. ISBN 9783659134821.