Electromigration in thin films and electronic devices
Kim Choong-UnKniha
Citace v seznamu literatury:
KIM, Choong-Un. Electromigration in thin films and electronic devices: materials and reliability. Woodhead Publishing in materials. Oxford: Woodhead Pub., 2011. ISBN 9780857093752. Dostupné také z: https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpETFEDMR1/electromigration_in_thin_films_and_electronic_devices__materials_and_reliability.