Value analysis tear-down
Sato Yoshihiko, Kaufman J. JerryKniha
Citace v seznamu literatury:
SATO, Yoshihiko a KAUFMAN, J. Jerry. Value analysis tear-down: a new process for product development and innovation. New York: Industrial Press, 2005. ISBN 9781615835799. Dostupné také z: https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpVATANPP1/value_analysis_teardown__a_new_process_for_product_development_and_innovation.